493. WE-Heraeus-Seminar: Latest developments in Scanning Probe Techniques focused on Nanotechnology

Scanning Probe Microscopy (SPM) has revolutionized experimental science by providing a wide variety of unique methods to image, characterize and manipulate objects at the nanoscale. Rapid development of the methodology of SPM continues to excite researchers around the world. The announced 493.WE-Heraeus-Seminar will allow the younger scientists actively working in the field of SPM to share their knowledge and experience. The program of the meeting will be accomplished in 4 days and will include 23 invited talks and a poster session. PhD students who have already started their research in the field of SPM are especially encouraged to attend and present their research in the poster session.

List of invited speakers:

Christian Ast, Max-Plank-Institute, Stuttgart, Germany
Willi Auwärter, University of Technology, Munich, Germany
Kirsten von Bergmann, University of Hamburg, Germany
Ivan Brihuega, Universidad Autonoma de Madrid, Spain
Thomas Frederiksen, Donostia International Physics Center, Donostia, Spain
Leo Gross, IBM, Zurich, Switzerland
Stefan Heinze, University of Kiel, Germany
Markus Heyde, Fritz-Haber-Institute, Berlin, Germany
Cyrus Hirjibehedin, University College London, UK
Pavel Jelinek, Institute of Physics of Czech Academy of Sciences, Prague, Czech Republic
Jörg Kröger, Technical University of Ilemanu, Germany
Laurent Limot, Institute of Physics and Chemistry of Materials, Strasbourg, France
Sebastian Loth, IBM, Almaden, USA
Yuri Mokrousov, Forschungszentrum Jülich, Germany
Jascha Repp, University of Regensburg, Germany
Guillaume Schull, Institute of Physics and Chemistry of Materials, Strasbourg, France
Alexander Schwarz, University of Hamburg, Germany
Hélène le Sueur, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, Orsay, France
Isabel Torrente, Freie Universität Berlin, Germany
Peter Wahl, Max-Plank-Institute, Stuttgart, Germany
Maarten Wegewijs, Forschungszentrum Jülich, Germany
Martin Wenderoth, University of Göttingen, Germany
Jens Wiebe, University of Hamburg, Germany